Description

The versatile Micron Optics Real Time- Component Test System (RT-CTS) is quite possibly the fastest (5 Hz sweeping operation), most accurate, widest dynamic range ( >60 dB) swept-wavelength instrument available today. This self-contained system is composed of a high power, low noise swept laser, an internal power monitor for normalization, a NIST-traceable optical reference, and two high-speed input detector channels.

The two standard input channels allow for real-time simultaneous transmission and reflection testing of one device, or simultaneous testing of two devices. Power and wavelength are automatically calibrated with each scan in less than 200 milliseconds.

The RT-CTS allows the user to rapidly sweep the wavelength range, collect data, and display the results during a manual or automated manufacturing process - all in real time.

Features

• High-speed measurements allow for real time feedback during production, increasing yields
• “All in One Box” solution is the fastest in the industry
• Internal NIST traceable absolute wavelength reference and power reference ensure accuracy
  and reliability
• Standard GPIB Interface
• Built-in color display

Applications

The Micron Optics RT-CTS can be used for testing fiber Bragg gratings, arrayed wave guides, optical filters, thin-film mux/demuxes and a wide variety of other fixed and tunable components. This versatility allows the RT-CTS to be designed into many critical in-process applications.

• Real time alignment of WDM components
  • Control FBG as it grows
  • Align optics and measure in real-time
• Final Characterization of WDM components
  • Measure device performance with high accuracy RT-CTS manual measurement techniques
• Quality inspection of WDM components
  • Set-up Pass/Fail inspection criteria, save traces & compare data
• Automated testing of WDM modules
  • Integrate RT-CTS into an Automated MFG station
  • Use EDFA, Photo Detector-Array and switches for complete WDM Swept Laser Solution
    
    
    

Time resolved
measurements of grating growth during exposure allow feedback control of manufacturing
processes. These are 4 snapshots of the
reflection and transmission spectra
obtained using the
Micron Optics RT-CTS.

Specifications