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Description
The versatile Micron Optics Wavelength and Power
Component Test System (si720T) is quite possibly the
fastest (5 Hz sweeping operation), most accurate (1 pm),
widest dynamic range ( >60 dB) swept-wavelength instrument
available today. This self-contained system is composed
of a high power, low noise swept laser, an internal power
monitor for normalization, a NIST-traceable optical reference,
and two high-speed input detector channels.
The two standard input channels allow for real-time simultaneous
transmission and reflection testing of one device, or simultaneous
testing of two devices. Power and wavelength are automatically
calibrated with each 200 millisecond scan.
The si720T allows the user to rapidly sweep the wavelength
range, collect data, and display the results during a manual
or automated manufacturing process - all in real time.
Features
- High-speed measurements allow
for real time feedback during production, increasing yields
- Two receiver channels to monitor transmission and reflection
properties simultaneously
- “All in One Box”
solution is the fastest in the industry
- Internal NIST traceable absolute
wavelength reference and power reference ensure accuracy
and reliability
- Standard GPIB Interface
- Built-in color display
Applications
The Micron Optics
si720T can be used for
testing fiber Bragg gratings, arrayed wave guides, optical
filters, thin-film mux/demuxes and a wide variety of other
fixed and tunable components. This versatility allows the
si720T to be designed into many critical in-process
applications.
- Real time alignment of WDM components
- Control FBG as it grows
- Align optics and measure in real-time
- Final Characterization of WDM
components
- Measure device performance
with high accuracy si720T manual measurement
techniques
- Quality inspection of WDM components
- Setup Pass/Fail inspection
criteria, save traces & compare data
- Automated testing of WDM modules
- Integrate si720T into
an automated manufacturing station
- Use EDFA, Photo Detector-Array
and switches for complete WDM Swept Laser Solution
Time resolved
measurements of grating growth during exposure allow feedback
control of manufacturing
processes. These are 4 snapshots of the
reflection and transmission spectra
obtained using the
Micron Optics si720T.
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